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HOME > Products > Hall effect IC > Reliability Test Terms for Hall effect IC

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Reliability Test Terms for Hall Effect IC

Test N Conditions Standard Time
High Humidity Storage Test
22
Ta = 85°C RH = 85%
Within +-20% of the initial value.
1000hrs
High Temperature Bias Test
22
Ta = 125°C VCC,VDD Bias voltage
Same as above
1000hrs
Heat-Proof Test for Soldering
22
Dipped in the 300+-5°C
solder up to the 1mm part from the body.
Same as above
5+-2 sec
High Temperature Storage Test
22
Ta = 150°C
Same as above
1000hrs
Heat Cycles Test
22
-55°C =>> Room Temperature =>> +150°C
30min <<= 5min <<= 30min
Same as above
50 cycles